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A Simple Spectral Method for Nanoplastic Identification and Characterisation
Summary
Researchers developed a fluorescence mapping method using Nile Red staining to locate, quantify, and identify polystyrene and polyethylene terephthalate nanoplastics down to 60 nm in size, overcoming the diffraction limits of conventional spectroscopy. Verification by scanning electron microscopy confirmed the technique can resolve individual nanoplastics of different types and sizes in complex real-world samples containing contaminant and additive nanoparticles.
Abstract Detecting and monitoring the presence of nanoplastics (NPs) in the environment is a challenge due to their small size compared to the diffraction limits (~ 300 nm) of conventional spectroscopy. To address this, we developed a straightforward fluorescence mapping technology capable of accurately locating, quantifying, and identifying Nile-Red-stained polystyrene and polyethylene terephthalate NPs down to sizes of 60 nm. Verification of the quantity and locations of dyed NPs within a scanned area was carried out by scanning electron microscopy in conjunction with fluorescence mapping analysis. The ability to successfully resolve individual NPs of different type and sizes in complex real-world samples in the presence of contaminant and chemical additive nanoparticles was demonstrated and provides the basis for low-cost rapid screening of NPs.