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Correction of panoramic raman spectra and its application for microplastics content analysis
Summary
Researchers developed a correction method for panoramic Raman spectra to eliminate artifacts created when stitching together individual spectral segments, improving the accuracy of wideband Raman spectroscopy applied to microplastic identification and analysis.
Одной из ключевых задач современной спектроскопии комбинационного рассеяния является получение высококачественных спектров в широком диапазоне волновых чисел при сохранении высокого разрешения. В данной работе описывается проблема возникновения артефактов при «сшивке» отдельных спектральных участков в панорамный спектр и предлагается решение в виде специально разработанного программного алгоритма для автоматической коррекции этих неточностей. Проведена апробация алгоритма на образцах, содержащие микропластики.
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