Controlled Detection for Micro- and Nanoplastic Spectroscopy/Photometry Integration Using Infrared Radiation

This paper suggests a perspective-controlled solution for an integrated Infrared micro-/nanoplastic spectroscopy/photometry-based detection, from the diffraction up to the geometry etendue, with the aim of yielding a universal spectrometer/photometer. Spectrophotometry, unlike spectroscopy that shows the interaction between matter and radiated energy, is a specific form of photometry that measures light parameters in a particular range as a function of wavelength. The solution, meant for diffraction grating and geometry etendue of the display unit, is provided by a controller that tunes the grating pitch to accommodate any emitted/transmitted wavelength from a sample made of microplastics, their degraded forms and their potential retention, and ensures that all the diffracted wavelengths are concentrated on the required etendue. The purpose is not only to go below the current Infrared limit of 20μm microplastic size, or to suggest an Infrared spectrophotometry geometry capable of detecting micro- and nanoplastics in the range of (1nm–20μm) for integrated nano- and micro-scales, but also to transform most of the pivotal components to be directly wavelength-independent. The related controlled geometry solutions, from the controlled grating slit-width up to the controlled display unit etendue functions, are suggested for a wider generic range integration. The results from image-size characterization show that the following charge-coupled devices, nanopixel CCDs, and/or micropixel CCDs of less than 100nm are required on the display unit, justifying the Infrared micro- and nanoplastic-integrated spectrophotometry, and the investigation conducted with other electromagnetic spectrum ranges that suggests a possible universal spectrometer/photometer.