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Cover Picture: Photoinduced Force Microscopy as an Efficient Method Towards the Detection of Nanoplastics (Chemistry ‐ Methods 5/2021)
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This is a cover picture description for a study on using photoinduced force microscopy to detect nanoplastics, showing polystyrene nanoplastics and how the technique uses a nano-scale tip as a detector to overcome the diffraction limit of infrared light. It is a journal cover note rather than a full article.
The Front Cover shows a polystyrene nanoplastics and how they are detected with photo-induced force microscopy infrared spectroscopy. This method overcomes the diffraction limit of infrared light by employing a nano-sized tip as detector. Oxidative degradation and chain scission occurred on the surface of the polystyrene nanoplastics in salt water, as depicted by the carbonyl and aliphatic functionalities. Detecting nano-sized plastic particles is essential for understanding how plastic waste breaks down into smaller particles in the environment. More information can be found in the Communication by Iris C. ten Have et al.
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Photoinduced Force Microscopy as an Efficient Method Towards the Detection of Nanoplastics
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Researchers used photoinduced force microscopy — a technique that overcomes the diffraction limit of conventional infrared spectroscopy — to detect and chemically characterize nanoplastic particles. The method revealed surface oxidation and chemical changes on polystyrene nanoplastics in salt water, demonstrating it can identify degraded nanoplastics that are too small for conventional IR detection.
Photoinduced Force Microscopy as an Efficient Method Towards the Detection of Nanoplastics
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Researchers demonstrated photoinduced force microscopy as an effective method for detecting and chemically characterizing individual nanoplastic particles, overcoming limitations of conventional techniques that lack either sufficient spatial resolution or spectroscopic capability at the nanoscale.
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Researchers developed a multi-technique approach combining standard micro-Raman spectroscopy with atomic force microscopy to characterize nanoplastics as small as 25 nm, achieving a mass detection limit of 8.6 attograms and demonstrating the capability to obtain single-particle spectra from sub-30 nm polystyrene nanoparticles.
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Researchers developed a multi-technique approach combining standard micro-Raman spectroscopy with atomic force microscopy to characterize nanoplastics as small as 25 nm, achieving a mass detection limit of 8.6 attograms and demonstrating the capability to obtain single-particle spectra from sub-30 nm polystyrene nanoparticles.
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