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Article ? AI-assigned paper type based on the abstract. Classification may not be perfect — flag errors using the feedback button. Tier 2 ? Original research — experimental, observational, or case-control study. Direct primary evidence. Sign in to save

Introducing “time-of-flight single particle investigator” (TOF-SPI): a tool for quantitative spICP-TOFMS data analysis

Journal of Analytical Atomic Spectrometry 2024 20 citations ? Citation count from OpenAlex, updated daily. May differ slightly from the publisher's own count. Score: 55 ? 0–100 AI score estimating relevance to the microplastics field. Papers below 30 are filtered from public browse.
Alexander Gundlach‐Graham, Stasia Harycki, Sarah E. Szakas, Tristen L. Taylor, Hark Karkee, Raven L. Buckman Johnson, Shahnaz Mukta, Rui Hu, Rui Hu, W. W. Lee

Summary

Researchers developed a new software tool called TOF-SPI for analyzing single-particle data from a mass spectrometry technique used to characterize tiny particles in environmental samples. The software provides accurate, high-throughput processing of particle composition data. The tool is designed to help scientists more efficiently identify and quantify nanoparticles and microplastics in complex samples.

TOF-SPI is software for accurate, robust, and high-throughput analysis of single-particle ICP-TOFMS data.

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