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Structure-Sensitive Properties of Materials Disclosed by a Combination of X-Ray Topography X-Ray Diffraction Analysis, and Electron Microscopy Methods
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This paper describes a combined suite of X-ray topography, diffraction analysis, and electron microscopy methods developed to establish correlations between lattice defects and structure-sensitive material properties. Applications included analysis of deformation in beryllium, germanium, and silicon crystals, and characterization of microplastic and elastic strain distributions around propagating cracks.
To establish a significant correlation between lattice defects and structure-sensitive properties it is frequently desirable to combine various methods of structural analysis which provide supplementary information and have a synergistic effect on the course of study. Such combination methods have been developed in this laboratory. They comprise: (a) selected area X-ray topography, (b) X-ray line profile analysis, (c) anomalous X-ray transmission topography, (d) X-ray double-crystal diffractometry, (e) analysis of plastic and elastic strain distribution by disturbance of X-ray pendellösung fringes (PF), (f) transmission electron microscopy (TEM) of dislocation structure in selected areas of the specimen, and (g) scanning electron microscopy (SEM) of the specimen. Examples of the application of these combination methods are presented that include the tensile and compressive deformation of beryllium crystals, the deformation and fracture of germanium and silicon crystals, and the elucidation of the distribution of microplastic and elastic strains in crack propagation.
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When a large batch of papers lands in the Atlas, we read through it and send a short write-up of what stood out.