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Anomalous tensoelectric effects in gallium arsenide tunnel diodes
Summary
Anomalous tensoelectric effects in gallium arsenide tunnel diodes under concentrated and hydrostatic loading arise from local microplastic strain induced by mechanical stress concentrators near the p-n junction. Analysis of irreversible current-voltage changes identified energy levels of plastic strain-induced defects, informing reliability assessment of semiconductor devices under mechanical stress.
Anomalous tensoelectric phenomena induced in a tunnel p-n junction by a concentrated load and by hydrostatic compression were studied. The anomalous tensoelectric effects are caused by the action of concentrators of mechanical stresses in the vicinity of the p-n junction, giving rise to local microplastic strain. Under the conditions of hydrostatic compression prolate inclusions ∿100–200 å long play the role of concentrators. Analysis of irreversible changes in the current-voltage characteristics of tunnel p-n junctions made it possible to separate the energy levels of the defects produced with plastic strain of gallium arsenide.