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MECHANICAL PROPERTIES, PHYSICS OF STRENGTH, AND PLASTICITY XRay and MagneticFieldEnhanced Change in Physical Characteristics of Silicon Crystals
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This duplicate entry describes the same physics study as paper 80054, examining how low-dose X-ray radiation and magnetic fields affect dislocation behavior and physical properties of silicon crystals. This is a condensed matter physics study with no relevance to environmental microplastics.
The effect of lowenergy ( W = 8 keV) lowdose ((0.3-7.3) × 10 2 Gy) radiation and a dc magnetic field (B = 0.17 T) on structural, micromechanical, and microplastic characteristics of silicon crystals has been studied. The features in the dynamic behavior of dislocations in silicon crystals, which manifest themselves upon only Xray exposure and combined (Xray and magnetic) exposure, have been revealed.
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