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X-ray and magnetic-field-enhanced change in physical characteristics of silicon crystals

Physics of the Solid State 2012 3 citations ? Citation count from OpenAlex, updated daily. May differ slightly from the publisher's own count.
В. А. Макара, L. P. Steblenko, A. N. Krit, D. V. Kalinichenko, A. N. Kurylyuk, S. N. Naumenko

Summary

This physics study examined how low-dose X-ray radiation and magnetic fields change the mechanical and structural properties of silicon crystals by affecting dislocation behavior. This is a condensed matter physics study with no relevance to environmental microplastics.

The effect of low-energy (W = 8 keV) low-dose ((0.3–7.3) × 102 Gy) radiation and a dc magnetic field (B = 0.17 T) on structural, micromechanical, and microplastic characteristics of silicon crystals has been studied. The features in the dynamic behavior of dislocations in silicon crystals, which manifest themselves upon only X-ray exposure and combined (X-ray and magnetic) exposure, have been revealed.

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