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X-ray and magnetic-field-enhanced change in physical characteristics of silicon crystals
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This physics study examined how low-dose X-ray radiation and magnetic fields change the mechanical and structural properties of silicon crystals by affecting dislocation behavior. This is a condensed matter physics study with no relevance to environmental microplastics.
The effect of low-energy (W = 8 keV) low-dose ((0.3–7.3) × 102 Gy) radiation and a dc magnetic field (B = 0.17 T) on structural, micromechanical, and microplastic characteristics of silicon crystals has been studied. The features in the dynamic behavior of dislocations in silicon crystals, which manifest themselves upon only X-ray exposure and combined (X-ray and magnetic) exposure, have been revealed.
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MECHANICAL PROPERTIES, PHYSICS OF STRENGTH, AND PLASTICITY XRay and MagneticFieldEnhanced Change in Physical Characteristics of Silicon Crystals
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This duplicate entry describes the same physics study as paper 80054, examining how low-dose X-ray radiation and magnetic fields affect dislocation behavior and physical properties of silicon crystals. This is a condensed matter physics study with no relevance to environmental microplastics.
The Change of Nanostructure and Microplastic Characteristics of the Silicon Crystals Under the Impact of Strong Magnetic Fields
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Researchers exposed silicon crystals to strong magnetic fields (9.4 Tesla) to study effects on their internal nanostructure and softness at microscopic scale. The magnetic fields affected crystals differently depending on added impurities (phosphorus or boron) and conductivity type, and triggered long-lasting structural changes linked to oxygen impurities in the silicon.
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This study used molecular dynamics simulations to investigate how indenter size affects the nanoscale plastic deformation of silicon. It is a materials science study on nanomechanics and is not related to environmental microplastics.
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Researchers used high-energy synchrotron X-ray diffraction to observe in real time how dislocation structures in polycrystalline copper evolve when the direction of deformation is changed. It is a fundamental materials physics study using 'plasticity' in its metallurgical sense, unrelated to environmental microplastic research.
Structure-Sensitive Properties of Materials Disclosed by a Combination of X-Ray Topography X-Ray Diffraction Analysis, and Electron Microscopy Methods
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This paper describes a combined suite of X-ray topography, diffraction analysis, and electron microscopy methods developed to establish correlations between lattice defects and structure-sensitive material properties. Applications included analysis of deformation in beryllium, germanium, and silicon crystals, and characterization of microplastic and elastic strain distributions around propagating cracks.
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