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X-ray and magnetic-field-enhanced change in physical characteristics of silicon crystals
Summary
This physics study examined how low-dose X-ray radiation and magnetic fields change the mechanical and structural properties of silicon crystals by affecting dislocation behavior. This is a condensed matter physics study with no relevance to environmental microplastics.
The effect of low-energy (W = 8 keV) low-dose ((0.3–7.3) × 102 Gy) radiation and a dc magnetic field (B = 0.17 T) on structural, micromechanical, and microplastic characteristics of silicon crystals has been studied. The features in the dynamic behavior of dislocations in silicon crystals, which manifest themselves upon only X-ray exposure and combined (X-ray and magnetic) exposure, have been revealed.
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