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Linking the physical and chemical characteristics of single small microplastics or nanoplastics via photolithographic silicon substrates
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Researchers developed photolithographic silicon substrates as a platform to co-locate individual small microplastics and nanoplastics, enabling simultaneous morphological and chemical characterization of the same single particles using multiple analytical instruments.
Small microplastics and nanoplastics are of growing concern as they pose more risks to ecological and human health than larger particles. However, characterization of the morphological and chemical features of single particles faces a major challenge if instrumental combination is not available. Here, we developed a marker system via computer aided design and crafted it on a silicon substrate (8 × 8 mm) via direct-write lithography. We dripped 20 μL of a solution containing tiny particles extracted from a highly weathered plastic fragment onto a silicon substrate. After the solution was oven-dried, the polymer composition of particles down to 895 nm was located via multiple markers and identified using micro-Raman. The lithographic substrate was then transferred to a scanning electron microscope with energy dispersive spectroscopy capability, and the surface morphology and element distribution were captured for the same particle. Similarly, the morphology and surface elevation were characterized using a scanning electron microscope and an atomic force microscope. The average retrieval rate for particles reached 86% if all characterization experiments were conducted within one week. Our results suggest that photolithographic silicon substrates provide a novel and economical way to link the physicochemical characteristics of small microplastics and parts of nanoplastics.
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