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Photo induced force microscopy: chemical spectroscopy beyond the diffraction limit
Summary
This review examines photo-induced force microscopy as an approach for near-field chemical spectroscopy, synthesizing advances in using electromagnetic radiation to interrogate surface properties at nanometre spatial resolution beyond the optical diffraction limit.
Over the last decade remarkable advances have been made in creating spectroscopic tools to interrogate surface properties using electromagnetic radiation in the near field, achieving lateral resolutions in the nanometre range.
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