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Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review

Journal of Applied Polymer Science 2022 22 citations ? Citation count from OpenAlex, updated daily. May differ slightly from the publisher's own count. Score: 40 ? 0–100 AI score estimating relevance to the microplastics field. Papers below 30 are filtered from public browse.

Miran Mozetič, Ananthu Prasad, Ananthu Prasad, Sabu Thomas Nisa V. Salim, Miran Mozetič, Sabu Thomas Lekshmi Kailas, Nisa V. Salim, Sabu Thomas Sabu Thomas Sabu Thomas

Summary

This review examines time-of-flight secondary ion mass spectrometry (ToF-SIMS) as a surface-sensitive analytical technique for characterizing polymer chemistry, highlighting its superior compound specificity compared to XPS and Auger electron spectroscopy for polymer surface analysis.

Abstract Time of flight‐secondary ion mass spectrometry (ToF‐SIMS) is a SIMS based surface sensitive technique that provide specific compound identification of surface molecules. Recently, the importance of ToF‐SIMS has grown for the characterization and utilization of polymers, pharmaceuticals, semi‐conductors. The compound specificity of ToF‐SIMS distinguishes it from other surface characterization techniques such as X‐ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and so forth, making it a preferred tool for the effective surface analysis of polymers. The purpose of this review is to elucidate the capability of ToF‐SIMS technique to effectively analyze the surface chemistry of polymer materials.

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