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Imaging and Identification of Single Nanoplastic Particles and Agglomerates
Summary
Researchers developed a surface-enhanced Raman scattering (SERS) technique capable of imaging and identifying individual nanoplastic particles as small as 100 nm. The method provides a powerful new tool for detecting nanoplastics at the single-particle level, which is critical for understanding the full scope of plastic pollution.
Currently the extent of nanoplastic in the environment can only be estimated by extrapolation from the plastic waste that can be detected. To be able to quantify the whole extent of the problem, detection methods have to be developed that can also identify particles that are smaller than 1 $μ$m. Here we employ surface-enhanced Raman scattering (SERS) to image and identify single nanoplastic particles down to 100 nm in size. We obtain an experimental enhancement factor of more than three orders of magnitude measured on a single plastic particle instead of averaging over a concentration. Our results contribute to the better understanding and employment of SERS for nanoparticle detection and present an important step for the development of future sensors.