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Background signals in stimulated Raman scattering microscopy and current solutions to avoid them

Advances in Physics X 2023 19 citations ? Citation count from OpenAlex, updated daily. May differ slightly from the publisher's own count. Score: 45 ? 0–100 AI score estimating relevance to the microplastics field. Papers below 30 are filtered from public browse.
Luca Genchi, Sergey P. Laptenok, Luca Genchi, Luca Genchi, Sergey P. Laptenok, Sergey P. Laptenok, Luca Genchi, Sergey P. Laptenok, Luca Genchi, Sergey P. Laptenok, Sergey P. Laptenok, Sergey P. Laptenok, Carlo Liberale Carlo Liberale Carlo Liberale Carlo Liberale Carlo Liberale Carlo Liberale Carlo Liberale

Summary

This review identifies and categorizes sources of background signals that complicate stimulated Raman scattering microscopy measurements, and surveys current solutions including spectral unmixing, modulation schemes, and sample preparation approaches that improve signal-to-noise ratios in this label-free imaging technique.

Stimulated Raman scattering (SRS) microscopy has gained popularity in recent years due to its linearity to molecule concentration and laser intensity, and to the lack of the nonresonant background that affects its analogous technique, coherent anti-Stokes Raman scattering. However, SRS is not a background-free technique. In fact, there are other optical processes – nonlinear transient scattering and nonlinear transient absorption – that can be detrimental to the contrast and sensitivity of SRS microscopy. In this review, we provide a description of these competing optical processes and present an up-to-date description of current solutions to minimize their effect on SRS measurements.

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