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Low-Cost Thermal-Infrared ‘THz-Torch’ Spectroscopy

IEEE Access 2024 2 citations ? Citation count from OpenAlex, updated daily. May differ slightly from the publisher's own count. Score: 40 ? 0–100 AI score estimating relevance to the microplastics field. Papers below 30 are filtered from public browse.
Saleh Komies, Saleh Komies, Jonathan S. Watson, Jingye Sun, Jingye Sun, Chris Hodges, Stephen A. Lynch, Jonathan S. Watson, Stepan Lucyszyn

Summary

This paper is not relevant to microplastics research; it describes a low-cost thermal-infrared spectroscopy technique ('THz-Torch') for non-destructive material characterization, demonstrated on glass, semiconductor, ceramic, and plastic materials.

The low-cost thermal infrared ‘THz-Torch’ concept (referred to here as ‘THz-T’) was first introduced over a decade ago, and since then the associated ‘over the THz horizon’ thermal infrared (10-100 THz) implementation technologies have continued to advance. While short range secure wireless communications links have received a great deal of attention, material spectroscopy has only briefly been introduced in a short conference abstract. Here, for the first time, we explore in depth the basic concepts behind THz-T spectroscopy. Moreover, when compared to the unvalidated results within our previous work, we demonstrate an enhanced experimental THz-T spectrometer. A detailed thermal noise power link budget model for both the transmission and reflection modes of operation have been undertaken and independently validated. As a proof of principle, a diverse array of different material types has been characterized. This includes glass sheets, semiconductor wafers, ceramic plate, plastic tape, plastic sheets, as well as polymer and cotton paper banknotes. THz-T technology has the advantages of hardware simplicity and low cost non-destructive testing for ubiquitous applications.

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