We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
Direct Characterization of Halogen-Based Microplastics via Single-Event ICP-Mass Spectrometry in Negative-Ion Mode.
Summary
Scientists have developed a more sensitive way to detect two common types of plastic particles, Teflon (PTFE) and PVC, that can be smaller than a speck of dust, using a specialized lab technique that spots chlorine and fluorine, the chemical "fingerprints" of these plastics. This matters because before we can figure out whether tiny plastic particles in our food, water, or bodies are harmful, we first need reliable tools to actually find and measure them, and this new method can detect particles even smaller than previous techniques could catch.
Halogen-containing microplastics such as polytetrafluoroethylene (PTFE) and poly(vinyl chloride) (PVC) are analytically relevant targets, yet their selective characterization by ICP-MS remains challenging, particularly for fluoropolymers due to the limited formation of F+ in conventional positive-ion mode. Here we introduce negative-ion single-event ICP-MS as a direct strategy for particle-resolved characterization of halogen-containing microplastics by monitoring F- and Cl- on a quadrupole ICP-MS without plasma modifiers or proxy-ion chemistry. PTFE and PVC particle standards were used as well-defined model systems, with scanning electron microscopy (SEM) confirming particle morphology and size distributions. Key acquisition and instrumental conditions governing event detectability were systematically optimized, enabling reliable transient detection at a dwell time of 100 μs. Using a conventional spray-chamber configuration, size detection limits of 1.18 μm (PTFE) and 0.73 μm (PVC) were achieved, improving to 0.68 μm (PTFE) and 0.45 μm (PVC) with a high-efficiency sample introduction system. Quantification strategies for negative-mode operation, including external calibration and transport-efficiency-based workflows, were further assessed. Overall, this work establishes negative-ion mode single-event ICP-MS as a direct platform for fluorine- and chlorine-selective microplastic detection and sizing, expanding the analytical scope of particle-resolved microplastic analysis beyond indirect fluorine detection or carbon-based approaches.